A. Kharitonov, Abdulrahman Nahhas, M. Pohl, K. Turowski
{"title":"Comparative analysis of machine learning models for anomaly detection in manufacturing","authors":"A. Kharitonov, Abdulrahman Nahhas, M. Pohl, K. Turowski","doi":"10.1016/j.procs.2022.01.330","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":73515,"journal":{"name":"ISM ... : ... IEEE International Symposium on Multimedia ... : proceedings. IEEE International Symposium on Multimedia","volume":"73 1","pages":"1288-1297"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISM ... : ... IEEE International Symposium on Multimedia ... : proceedings. IEEE International Symposium on Multimedia","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.procs.2022.01.330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}