{"title":"Electromagnetic imaging of permittivity profiles by an improved spectral inverse technique","authors":"Hyun-Chulchoi, Se-Yun Kim, J. Ra","doi":"10.1109/APS.1989.134623","DOIUrl":null,"url":null,"abstract":"A way to improve the ill-posedness of inverse scattering problems by making the cell size of the discretization much larger is proposed. In order to see the effect of the larger cell discretization, a 24-cell structure (0.1 lambda *0.1 lambda ) is divided into 4 large cells (0.1 lambda *0.6 lambda ). Step and continuous permittivity profiles are reconstructed by the 24-cell discretization and the 4-cell discretization, respectively, for X/sub 0/=0.3 lambda . The 4-cell discretization gives a result very close to the original dielectric profile, but the computation time is reduced significantly compared to the 24-cell inversion since the number of unknowns for 4-cell discretization is reduced to 12 from 24.<<ETX>>","PeriodicalId":11330,"journal":{"name":"Digest on Antennas and Propagation Society International Symposium","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1989-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest on Antennas and Propagation Society International Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APS.1989.134623","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A way to improve the ill-posedness of inverse scattering problems by making the cell size of the discretization much larger is proposed. In order to see the effect of the larger cell discretization, a 24-cell structure (0.1 lambda *0.1 lambda ) is divided into 4 large cells (0.1 lambda *0.6 lambda ). Step and continuous permittivity profiles are reconstructed by the 24-cell discretization and the 4-cell discretization, respectively, for X/sub 0/=0.3 lambda . The 4-cell discretization gives a result very close to the original dielectric profile, but the computation time is reduced significantly compared to the 24-cell inversion since the number of unknowns for 4-cell discretization is reduced to 12 from 24.<>
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