{"title":"Coupling of transient ultra wide band electro-magnetic fields to complex electronic systems","authors":"M. Camp, H. Garbe, F. Sabath","doi":"10.1109/ISEMC.2005.1513563","DOIUrl":null,"url":null,"abstract":"In this paper the coupling of transient ultra wide band field pulses to complex electronic systems is determined. Different test setups of microcontroller circuits were used to investigate the coupling effects and to describe the injected interference parameters.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"24 1","pages":"483-488 Vol. 2"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2005.1513563","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
In this paper the coupling of transient ultra wide band field pulses to complex electronic systems is determined. Different test setups of microcontroller circuits were used to investigate the coupling effects and to describe the injected interference parameters.