Multifunctional tool for expanding AFM-based applications

S. Deladi, N. Tas, G. Krijnen, M. Elwenspoek
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引用次数: 1

Abstract

A multifunctional tool which expands the application field of atomic force microscope-based surface modification is presented. The AFM-probe can be used for surface modification and in-situ characterization at the same time, due to a special configuration with two cantilevers. Various applications from different fields are presented, which were carried out with one and the same tool: in-situ characterization of wear generated with and without local lubrication (tribology), fountain-pen lithography in which material is deposited or removed (physical chemistry), and electrochemical metal deposition (electrochemistry).
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扩展基于afm的应用程序的多功能工具
提出了一种扩展原子力显微镜表面改性应用领域的多功能工具。由于具有两个悬臂的特殊结构,afm探针可以同时用于表面改性和原位表征。介绍了不同领域的各种应用,这些应用都是用同一种工具进行的:有和没有局部润滑产生的磨损的原位表征(摩擦学),沉积或去除材料的钢笔光刻(物理化学),以及电化学金属沉积(电化学)。
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