M. Jeroense, M. Lindgren, A. Gustafsson, T. Schutte
{"title":"Interface charge in polymer laminates","authors":"M. Jeroense, M. Lindgren, A. Gustafsson, T. Schutte","doi":"10.1109/ICSD.1998.709226","DOIUrl":null,"url":null,"abstract":"Dielectric sample combinations were tested in a Pulse Electro Acoustic measurement set-up. It was seen that charge accumulates in a predictable way due to a difference in resistivity and permittivity of the materials. Furthermore it was seen that flame-oxidation of the surface of a specific material diminishes the charge accumulation at the insulator/insulator interface. No relation could be found between different grades of surface roughness and charge accumulation at the interface.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"213 1","pages":"55-59"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709226","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Dielectric sample combinations were tested in a Pulse Electro Acoustic measurement set-up. It was seen that charge accumulates in a predictable way due to a difference in resistivity and permittivity of the materials. Furthermore it was seen that flame-oxidation of the surface of a specific material diminishes the charge accumulation at the insulator/insulator interface. No relation could be found between different grades of surface roughness and charge accumulation at the interface.