Comparison of Electrochemical Polishing Treatments between Phosphoric Acid and a Deep Eutectic Solvent for High-Purity Copper

T. Abdel-Fattah, J. Loftis
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引用次数: 1

Abstract

This study investigated and compared the acid-free electropolishing of copper with the state-of-the-art acidic electropolishing process. The acid-free medium used in this study is based on a deep eutectic solvent comprised of 2:1 ethylene glycol and choline chloride. The electrochemical study included voltammetry and chronoamperometry tests during the electropolishing process. The characterization techniques used were atomic force microscopy (AFM) and digital microscopy, and surface morphology comparisons summarized the electropolishing efficiency of phosphoric acid and acid-free deep eutectic solvent treatments for high-purity copper. Electropolishing copper with a deep eutectic solvent resulted in a mirror finish and a post-treatment surface that was 8× smoother than the original metal surface prior to electropolishing treatments with a smoothing efficiency of 91.1 ± 1.5%. This eco-friendly solution produced polished surfaces superior to those surfaces treated with industry standard acid electrochemistry treatments of 1 M H3PO4.
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磷酸与深共晶溶剂对高纯铜电化学抛光处理的比较
本研究对铜的无酸电解抛光工艺和目前最先进的酸性电解抛光工艺进行了研究和比较。本研究中使用的无酸介质是基于由2:1乙二醇和氯化胆碱组成的深度共晶溶剂。电化学研究包括电解抛光过程中的伏安法和计时安培法测试。采用原子力显微镜(AFM)和数字显微镜进行表征,并通过表面形貌比较总结了磷酸和无酸深共晶溶剂处理对高纯铜的电抛光效率。用深度共晶溶剂对铜进行电抛光后,表面光洁度达到镜面光洁度的8倍,抛光效率为91.1±1.5%。这种环保溶液产生的抛光表面优于工业标准的1 M H3PO4酸电化学处理的表面。
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