Preparation, structural investigation and optical properties determination of composite films based on PAZO polymer doped with GeTe4-Cu chalcogenide particles

IF 0.9 4区 物理与天体物理 Q4 PHYSICS, APPLIED European Physical Journal-applied Physics Pub Date : 2021-09-01 DOI:10.1051/EPJAP/2021210104
A. Stoilova, D. Dimov, Y. Trifonova, V. Lilova, B. Blagoeva, D. Nazarova, L. Nedelchev
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引用次数: 1

Abstract

The work presents preparation, structural investigation and optical properties determination of composite films based on the azopolymer (poly[1-[4-(3-carboxy-4-hydroxyphenylazo)benzenesulfonamido]-1,2-ethanediyl, sodium salt]), shortly PAZO, doped with 1 wt.% particles of the previously synthesized by us new tellurium containing chalcogenide system (GeTe4 )100-x Cux , where x  = 5, 10, 15 and 20 mol.%. X-Ray diffraction (XRD) was applied to analyze the structure of the chalcogenide bulk material. Transmission electron microscopy (TEM) has been used to study the particles and the composite films morphology. The transmittance coefficient (T ), the reflectance coefficient (R ), the refractive index (n ), the extinction coefficient (k ), the optical absorption coefficient (α ) and the optical band gap ( ) of the composite films were determined. Birefringence was induced by a He-Cd laser with a wavelength 442 nm and measured with probe Diode Pumped Solid State (DPSS) laser at 635 nm. The influence of the dopants concentration on the optical performance of the composite films has been discussed.
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GeTe4-Cu硫系粒子掺杂PAZO聚合物复合膜的制备、结构研究及光学性能测定
本文介绍了偶氮聚合物(聚[1-[4-(3-羧基-4-羟基苯基偶氮)苯磺酰胺]-1,2-乙二基钠盐])的制备、结构研究和光学性能测定,简称PAZO,掺杂1 wt。先前合成的新含碲硫系(GeTe4)100-x Cux,其中x = 5、10、15和20 mol。采用x射线衍射(XRD)分析了硫族化物块状材料的结构。利用透射电子显微镜(TEM)对颗粒和复合膜形貌进行了研究。测定了复合薄膜的透射系数(T)、反射系数(R)、折射率(n)、消光系数(k)、光学吸收系数(α)和光学带隙()。用波长为442 nm的He-Cd激光器诱导双折射,用探针二极管泵浦固体激光器(DPSS)在635 nm处测量双折射。讨论了掺杂剂浓度对复合薄膜光学性能的影响。
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来源期刊
CiteScore
1.90
自引率
10.00%
发文量
84
审稿时长
1.9 months
期刊介绍: EPJ AP an international journal devoted to the promotion of the recent progresses in all fields of applied physics. The articles published in EPJ AP span the whole spectrum of applied physics research.
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