Characterization of advanced epitaxial structures

B. Hamilton , A.R. Parker
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引用次数: 2

Abstract

The evolution of the MOVPE growth technology has led to highly pure materials and to complex multi-layer structures. In turn this has led to new challenges for the characterisation of materials, and experimental methods are also evolving to meet this challenge. In this review we attempt to focus attention on techniques which probe some of the key materials parameters for advanced structures: Ultra high purity layers and atomically sharp systems.

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先进外延结构的表征
MOVPE生长技术的发展导致了高纯度材料和复杂的多层结构。这反过来又给材料的表征带来了新的挑战,实验方法也在不断发展以应对这一挑战。在这篇综述中,我们试图把重点放在研究先进结构的一些关键材料参数的技术上:超高纯度层和原子锐系统。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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Editorial Board Subject index Editorial Board Micromorphology of as-grown surfaces of crystals International School on Crystal Growth and Crystallographic Assessment of Industrial Materials
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