A. Chiou, Wen Wang, G. Sonek, John H. Hong, M. Berns
{"title":"Interferometric optical tweezers","authors":"A. Chiou, Wen Wang, G. Sonek, John H. Hong, M. Berns","doi":"10.1364/OPN.7.12.000011","DOIUrl":null,"url":null,"abstract":"Summary form only given. Optical trapping of micron-size dielectric microspheres using a single beam gradient force was first demonstrated by Ashkin in 1986. Since then, extensive research and development of this technique have turned it into a practical device (known as optical tweezers), which has been used in a wide variety of biological and biomedical applications. In this paper, we report the first experimental observation, we believe, of trapping and manipulation of dielectric particles by a set of two-beam interference fringes.","PeriodicalId":22169,"journal":{"name":"Summaries of papers presented at the Conference on Lasers and Electro-Optics","volume":"72 1","pages":"104-105"},"PeriodicalIF":0.0000,"publicationDate":"1996-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"91","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Summaries of papers presented at the Conference on Lasers and Electro-Optics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/OPN.7.12.000011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 91
Abstract
Summary form only given. Optical trapping of micron-size dielectric microspheres using a single beam gradient force was first demonstrated by Ashkin in 1986. Since then, extensive research and development of this technique have turned it into a practical device (known as optical tweezers), which has been used in a wide variety of biological and biomedical applications. In this paper, we report the first experimental observation, we believe, of trapping and manipulation of dielectric particles by a set of two-beam interference fringes.