Tunable and weakly invasive probing of a superconducting resonator based on electromagnetically induced transparency

B. Ann, G. Steele
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引用次数: 6

Abstract

Superconducting cavities with high quality factors play an essential role in circuit quantum electrodynamics and quantum computing. In measurements of the the intrinsic loss rates of high frequency modes, it can be challenging to design an appropriate coupling to the measurement circuit in such a way that the resulting signal is sufficiently strong but also that this coupling does not lead to unwanted loading circuit, obscuring the intrinsic internal loss rates. Here, we propose and demonstrate a spectroscopic probe of high-Q resonators based on the phenomena of electromagnetically-induced transparency (EIT) between the resonator and qubit in the weak dispersive coupling regime. Applying a sideband drive signal to the qubit, we observe an interference dip originated from EIT in the qubit spectroscopy, originating from the quantum interference between the qubit probe signal and sideband transition. From the width and the depth of the dip, we are able to extract the single-photon linewidth of the resonator from an analytical model. Working in a previously unexplored regime in which the qubit has a larger linewidth than the resonator reduces the technical challenge of making a high-coherence qubit and is advantageous for remaining in the weakly-invasive limit of coupling to the resonator. Furthermore, the sideband and the dispersive coupling between the resonator and the qubit can be tuned $in~situ$ controlling the strength of the sideband drive power. This $in-situ$ tuneability allows the technique to be applied for efficient measurement of the resonator loss rate for any quality factor below a fixed upper bound, on the order of $10^8$ for our device, allowing a wide range of quality factors to probed using a single design.
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基于电磁感应透明的超导谐振腔的可调谐弱侵入探测
具有高质量因数的超导空腔在电路量子电动力学和量子计算中起着至关重要的作用。在测量高频模式的本征损耗率时,设计一个适当的耦合到测量电路是一项挑战,在这样一种方式下,所得到的信号足够强,而且这种耦合不会导致不必要的负载电路,从而掩盖了本征内部损耗率。在这里,我们提出并演示了一种基于弱色散耦合下谐振器和量子比特之间的电磁诱导透明(EIT)现象的高q谐振器的光谱探针。将边带驱动信号应用于量子比特,我们观察到量子比特光谱中由EIT引起的干涉倾角,这是由于量子比特探针信号与边带跃迁之间的量子干涉。从倾角的宽度和深度,我们可以从解析模型中提取谐振器的单光子线宽。在以前未开发的情况下工作,量子位具有比谐振器更大的线宽,减少了制造高相干量子位的技术挑战,并且有利于保持与谐振器耦合的弱侵入限制。此外,谐振腔与量子比特之间的边带和色散耦合可以就地调谐,从而控制边带驱动功率的强度。这种原位可调谐性使该技术可用于有效测量低于固定上界的任何质量因子的谐振器损失率,对于我们的设备,其数量级为10^8$,允许使用单一设计探测广泛的质量因子。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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