Time truncated control chart using log logistic distribution

G. Srinivasa Rao, Edward R. Paul
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引用次数: 2

Abstract

Control charts are considered as important tools when producer wants to produce goods or services of high–quality. These charts help producers to manufacture products based on specified limits by monitoring the quality beforehand.1 There are a number of control charts developed to monitor production process in different situations. One of the major characteristics of many control charts is that the production process should follow normal distribution. Ouyang et al.2 and Pearn and Wu3 they mentioned efficiency of process capability (PC) based on the production process which follows normally distributed processes. According to Aslam and Jun1 there are also other control charts which are developed based on non–normal distributions which are being used when the production process follows other distributions rather than normal. Rao4 developed a control chart for time truncated life tests using exponentiated half logistic distribution and Rao et al.5 constructed attribute control charts for the Dagum distribution under truncated life tests.
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使用对数逻辑分布的时间截断控制图
当生产者想要生产高质量的产品或服务时,控制图被认为是重要的工具。这些图表通过事先监测质量,帮助生产者根据规定的限量生产产品在不同的情况下,开发了许多控制图来监控生产过程。许多控制图的主要特征之一是生产过程应遵循正态分布。欧阳等人2和Pearn和Wu3他们提到了基于遵循正态分布过程的生产过程的过程能力(PC)效率。根据Aslam和Jun1的说法,还有其他基于非正态分布的控制图,当生产过程遵循其他分布而不是正态分布时,使用这些控制图。Rao4利用指数半logistic分布构造了时间截断寿命试验的控制图,Rao等5构造了截断寿命试验下Dagum分布的属性控制图。
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