{"title":"A broad-band scalable lumped-element inductor model using analytic expressions to incorporate skin effect, substrate loss, and proximity effect","authors":"F. Rotella, V. Blaschke, D. Howard","doi":"10.1109/IEDM.2002.1175881","DOIUrl":null,"url":null,"abstract":"A new broad-band scalable spiral inductor model incorporating skin effect, substrate loss, and proximity effect is presented. The construction of the lumped element model using analytic expressions is described and the model is validated with data from multiple technologies. Extensions to differential inductors with measured validation is also provided.","PeriodicalId":74909,"journal":{"name":"Technical digest. International Electron Devices Meeting","volume":"122 1","pages":"471-474"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical digest. International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2002.1175881","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 30
Abstract
A new broad-band scalable spiral inductor model incorporating skin effect, substrate loss, and proximity effect is presented. The construction of the lumped element model using analytic expressions is described and the model is validated with data from multiple technologies. Extensions to differential inductors with measured validation is also provided.
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