EFFECT OF INTERMOLECULAR FORCES ON THIN FILM INSTABILITY

E. Tian
{"title":"EFFECT OF INTERMOLECULAR FORCES ON THIN FILM INSTABILITY","authors":"E. Tian","doi":"10.12732/IJAM.V31I2.1","DOIUrl":null,"url":null,"abstract":"We consider the effect of van der Waals intermolecular forces on instability problems occurring in thin liquid film pattern formation induced by an electric field. The physical setup is a layer of thin liquid film sandwiched between two electrodes and separated by an air gap from the top mask electrode. We formulate the nonlinear parabolic fourth order thin film equation by deriving van der Waals forces, electric induced forces and incorporate the surface tension in the model. In the long wavelength limit, we find that perturbations at the interface undergo regulated dynamics and the initial film thickness plays a critical role in the pattern formation process. AMS Subject Classification: 35B36, 65P40, 76A20, 76E17","PeriodicalId":14365,"journal":{"name":"International journal of pure and applied mathematics","volume":"1 1","pages":"171-180"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International journal of pure and applied mathematics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12732/IJAM.V31I2.1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

We consider the effect of van der Waals intermolecular forces on instability problems occurring in thin liquid film pattern formation induced by an electric field. The physical setup is a layer of thin liquid film sandwiched between two electrodes and separated by an air gap from the top mask electrode. We formulate the nonlinear parabolic fourth order thin film equation by deriving van der Waals forces, electric induced forces and incorporate the surface tension in the model. In the long wavelength limit, we find that perturbations at the interface undergo regulated dynamics and the initial film thickness plays a critical role in the pattern formation process. AMS Subject Classification: 35B36, 65P40, 76A20, 76E17
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分子间作用力对薄膜不稳定性的影响
我们考虑了范德华分子间力对在电场诱导下形成的液体薄膜的不稳定性问题的影响。物理装置是一层薄薄的液体膜夹在两个电极之间,并与顶部掩膜电极之间的气隙分开。通过推导范德华力和电致力,建立了非线性抛物型四阶薄膜方程,并将表面张力纳入模型。在长波长极限下,我们发现界面处的微扰经历了调节的动力学过程,并且初始膜厚度在图案形成过程中起着关键作用。学科分类:35B36, 65P40, 76A20, 76E17
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