{"title":"Monte Carlo simulation for predicting neutron-induced single-event upset in ferroelectric random access memory","authors":"Hong Zhang, Jing Huang, H. Guo, Z. Lei, B. Li","doi":"10.1080/07315171.2021.1971011","DOIUrl":null,"url":null,"abstract":"Abstract The influence of the single event effects (SEE) induced by neutron up to 14 MeV on ferroelectric random access memory (FRAM) is simulated by the Monte Carlo method. Simulation results show that single-event upset (SEU) occurs in FRAM when the neutron energy is greater than 6 MeV, and the average energy deposition of neutrons in the sensitive volume increases with increasing neutron energy. Neutron SEU in FRAM occurs when the energy deposition of a single secondary particles generated by a nuclear reaction in the sensitive region exceeds the critical energy. The neutron SEU cross-section of FRAM increases exponentially with increasing energy in the range of 6–14 MeV, and the SEU cross-section is about 1.39 × 10−14 cm2 at 14 MeV. These findings are due to concomitant increases in the variety and numbers of secondary particles whose energy deposition in the sensitive region exceeds the critical energy.","PeriodicalId":50451,"journal":{"name":"Ferroelectrics Letters Section","volume":null,"pages":null},"PeriodicalIF":1.3000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ferroelectrics Letters Section","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1080/07315171.2021.1971011","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
Abstract The influence of the single event effects (SEE) induced by neutron up to 14 MeV on ferroelectric random access memory (FRAM) is simulated by the Monte Carlo method. Simulation results show that single-event upset (SEU) occurs in FRAM when the neutron energy is greater than 6 MeV, and the average energy deposition of neutrons in the sensitive volume increases with increasing neutron energy. Neutron SEU in FRAM occurs when the energy deposition of a single secondary particles generated by a nuclear reaction in the sensitive region exceeds the critical energy. The neutron SEU cross-section of FRAM increases exponentially with increasing energy in the range of 6–14 MeV, and the SEU cross-section is about 1.39 × 10−14 cm2 at 14 MeV. These findings are due to concomitant increases in the variety and numbers of secondary particles whose energy deposition in the sensitive region exceeds the critical energy.
期刊介绍:
Ferroelectrics Letters is a separately published section of the international journal Ferroelectrics. Both sections publish theoretical, experimental and applied papers on ferroelectrics and related materials, including ferroelastics, ferroelectric ferromagnetics, electrooptics, piezoelectrics, pyroelectrics, nonlinear dielectrics, polymers and liquid crystals.
Ferroelectrics Letters permits the rapid publication of important, quality, short original papers on the theory, synthesis, properties and applications of ferroelectrics and related materials.