Secondary electron emission properties

Philips Journal of Research Pub Date : 1996-01-01 DOI:10.1016/S0165-5817(97)84681-5

J.J Scholtz, D Dijkkamp, R.W.A Schmitz

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引用次数: 128

Abstract

In this paper an introduction is given to secondary electron emission properties. It is shown that the reduced secondary emission yield $δ δ_{m}$ as a function of the reduced primary energy $E_{p} E_{m}$ can be described by a universal curve. It is found that it is easier to use the measurement of the maximum secondary electron emission δ_m and the energy E_m at which this maximum is reached to determine the suitability of a coating for use in the display than direct measurement of the first crossover energy E_I. The value of δ_m and E_m can be used to derive E_I. Furthermore, it is observed that in any material the elastic fraction of the secondary electrons exhibits a universal behaviour as a function of E_p. Fits to δ(E_p) and the energy distribution of the secondary electrons are proposed which can be used in Monte Carlo simulations.

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二次电子发射特性

本文介绍了二次电子发射特性。结果表明，二次发射还原产额δδm与一次能还原epm的关系可以用一条通用曲线来描述。研究发现，测量最大二次电子发射δm和达到该最大值的能量Em比直接测量第一次交叉能量EI更容易确定涂层是否适合用于显示器。δm和Em的值可以用来推导EI。此外，我们还观察到，在任何材料中，二次电子的弹性分数都表现出作为电位函数的普遍行为。提出了δ(Ep)的拟合和二次电子的能量分布，可用于蒙特卡罗模拟。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Philips Journal of Research

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