Measuring Intra-Canal Fluid Temperature Elevation and Ultrastructural Changes of Root Canal Surface During Irradiating With 940 Nm Diode Laser in Endodontic Treatment

Sheima’a A. Al-Zand, A. Mahmood, Tamara Al-Karadaghy, M. Al-Maliky
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Abstract

Objective: The purpose of this study was to observe the temperature elevation and evaluate the duration of its decreasing from root canal irrigant, as well as to observe smear layer removal ability of root canal surface when using of 940 nm diode laser as assistant in root canal sterilization. Background: laser irradiation may cause a thermal injury to the root structure and the surrounding periodontal tissues. Diode laser is weakly absorbed by water and tooth hard structure so it does not remove smear layer. Combination of chemical irrigants with diode laser irradiation in endodontics has superior results in removing the smear layer. Materials and methods : For this study, a total of 32 sound single rooted extracted human teeth were used. Twenty of them were randomly divided into two groups (n=10): Group A irradiated with 1.5 W CW of 940 nm diode laser for total irradiation time of 20 s, Group B irradiated with 2.5 W in Pulsed mode with frequency of 20 Hz for the same duration. K-type thermocouple was used to record temperature of fluid inside the canal during the rest period of lasing cycle at cervical portion of the root. Twelve teeth were divided into 6 groups (a, b, c, d, e, and f), two per group, where used for scanning electron microscope (SEM) characterization of root canal surface. These teeth were treated with different chemical irrigants and different laser powers. Then, longitudinally sectioned and prepared for imaging. Results: temperature elevation in both groups was acceptable with no significant difference between them (P > 0.01), the SEM showed increased smear layer removal ability during combination of chemical irrigants with diode laser. Conclusion: both laser powers were safe to be used as assistant in root canal sterilization as the temperature of fluid decrease quickly within 2 s, and the SEM images showed that the best results were achieved during combination of chemical irrigants with laser.
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940 Nm二极管激光照射根管治疗时根管内液体温度升高及根管表面超微结构变化的测量
目的:观察940 nm二极管激光辅助根管灭菌时,根管表面温度升高情况及温度下降持续时间,观察根管表面涂片层去除能力。背景:激光照射可对牙根结构和周围牙周组织造成热损伤。二极管激光受水和齿硬结构的吸收较弱,不能去除涂抹层。在牙髓学中,化学冲洗剂与二极管激光照射相结合,对去除牙髓脏污层有较好的效果。材料和方法:本研究共使用32颗健全的单根拔除人牙。其中20例随机分为两组(n=10): A组以1.5 W CW的940 nm二极管激光照射,总照射时间为20 s; B组以2.5 W的脉冲模式照射,频率为20 Hz,照射时间相同。使用k型热电偶记录根颈段激光周期休息时管内液体温度。将12颗牙分为a、b、c、d、e、f 6组,每组2颗,用于根管表面的扫描电镜(SEM)表征。这些牙齿用不同的化学冲洗剂和不同的激光功率进行治疗。然后纵向切片,准备成像。结果:两组患者温度升高均可接受,差异无统计学意义(P > 0.01),化学冲洗剂与二极管激光联合使用时,扫描电镜显示去除涂抹层的能力增强。结论:两种功率的激光辅助根管消毒是安全的,液体温度在2 s内迅速下降,扫描电镜图像显示化学冲洗剂与激光联合使用效果最好。
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