{"title":"Simultaneous measurement of electron beam size and divergence with an undulator","authors":"B. Yang, A. Lumpkin","doi":"10.1109/PAC.1999.794406","DOIUrl":null,"url":null,"abstract":"We present the simultaneous measurement of beam divergence and source size based on the APS diagnostic undulator line. A 300-/spl mu/m-thick Si(400) crystal monochromator is used to measure the divergence with a resolution down to 3 /spl mu/rad (1 /spl mu/rad with the third harmonic). X-rays transmitted through the crystal are simultaneously used by a pinhole camera to measure the beam size, at a resolution of about 40 /spl mu/m. We demonstrate that this measurement of emittance is robust against fluctuations of lattice functions due to a partial cancellation of systematic errors present in each of the measurements.","PeriodicalId":20453,"journal":{"name":"Proceedings of the 1999 Particle Accelerator Conference (Cat. No.99CH36366)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1999-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1999 Particle Accelerator Conference (Cat. No.99CH36366)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PAC.1999.794406","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
We present the simultaneous measurement of beam divergence and source size based on the APS diagnostic undulator line. A 300-/spl mu/m-thick Si(400) crystal monochromator is used to measure the divergence with a resolution down to 3 /spl mu/rad (1 /spl mu/rad with the third harmonic). X-rays transmitted through the crystal are simultaneously used by a pinhole camera to measure the beam size, at a resolution of about 40 /spl mu/m. We demonstrate that this measurement of emittance is robust against fluctuations of lattice functions due to a partial cancellation of systematic errors present in each of the measurements.
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