{"title":"P20 - A Method for In-Field Calibration for Periodical Technical Inspections Particle Counter Devices","authors":"H. Krasa, A. Bergmann, M. Kupper, M. Schriefl","doi":"10.5162/smsi2023/p20","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":22968,"journal":{"name":"The Poster","volume":"26 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Poster","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5162/smsi2023/p20","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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