An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs

Abstract

Reducing the cost of test (in particular by reducing its duration and the cost of the required ATE) is a common goal which has largely been pursued in the past, mainly by introducing suitable on chip Design for Testability (DfT) circuitry. Today, the increasing popularity of sophisticated DfT architectures and the parallel emergence of new ATE families allow the identification of innovative solutions effectively facing that goal. In this paper we face the increasingly common situation of SoCs adopting the IEEE 1149.1 and 1500 standards for the test of the internal cores, and explore the idea of storing the test program on the tester in a compressed form, and decompressing it on-the-fly during test application.