Novel Cause of Late Atrial Septal Defect Devices Embolization.

IF 0.7 Q4 CARDIAC & CARDIOVASCULAR SYSTEMS Journal of the Saudi Heart Association Pub Date : 2023-01-01 DOI:10.37616/2212-5043.1330
Wejdan Ba-Atiyah, Hala Gabel, Ahmad Jamjoom, Jameel Al-Ata
{"title":"Novel Cause of Late Atrial Septal Defect Devices Embolization.","authors":"Wejdan Ba-Atiyah,&nbsp;Hala Gabel,&nbsp;Ahmad Jamjoom,&nbsp;Jameel Al-Ata","doi":"10.37616/2212-5043.1330","DOIUrl":null,"url":null,"abstract":"<p><p>Transcatheter closure of septal defects using specialized devices is a common procedure that has a high success rate. Embolization of Atrial septal defect devices is a known complication seen at a rate of 0.5%. We report a case of late ASD device occluder embolization immediately after brain MRI with clinical consequences and intraoperative evidence of right atrial wall thermal injury. To our knowledge Atrial septal occluder (ASO) device embolization post magnetic resonance imaging (MRI) was not reported before, although theoretically possible and that's why six to eight weeks post device implantation MRI is prohibited even with current MRI compatible devices.</p>","PeriodicalId":17319,"journal":{"name":"Journal of the Saudi Heart Association","volume":"35 1","pages":"50-54"},"PeriodicalIF":0.7000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ftp.ncbi.nlm.nih.gov/pub/pmc/oa_pdf/74/5c/sha50-54.PMC10069705.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Saudi Heart Association","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.37616/2212-5043.1330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CARDIAC & CARDIOVASCULAR SYSTEMS","Score":null,"Total":0}
引用次数: 0

Abstract

Transcatheter closure of septal defects using specialized devices is a common procedure that has a high success rate. Embolization of Atrial septal defect devices is a known complication seen at a rate of 0.5%. We report a case of late ASD device occluder embolization immediately after brain MRI with clinical consequences and intraoperative evidence of right atrial wall thermal injury. To our knowledge Atrial septal occluder (ASO) device embolization post magnetic resonance imaging (MRI) was not reported before, although theoretically possible and that's why six to eight weeks post device implantation MRI is prohibited even with current MRI compatible devices.

Abstract Image

Abstract Image

Abstract Image

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
迟发性房间隔缺损的新病因栓塞装置。
使用专门的装置经导管关闭间隔缺损是一种常见的手术,成功率很高。房间隔缺损装置栓塞是一种已知的并发症,发生率为0.5%。我们报告一例晚期ASD设备闭塞栓塞后立即脑MRI的临床后果和术中证据右心房壁热损伤。据我们所知,在磁共振成像(MRI)后房间隔闭塞器(ASO)设备栓塞之前没有报道,尽管理论上是可能的,这就是为什么即使使用目前的MRI兼容设备,也禁止在设备植入后6至8周进行MRI。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Journal of the Saudi Heart Association
Journal of the Saudi Heart Association CARDIAC & CARDIOVASCULAR SYSTEMS-
CiteScore
1.40
自引率
0.00%
发文量
30
审稿时长
15 weeks
期刊最新文献
Zilebesiran and Hypertension: A Systematic Review and Meta-analysis. A Saudi Heart Association Position Statement on Cardiovascular Diseases and Diabetes Mellitus. Redo Minimally Invasive Right Atrial Mass Removal After Surgical Atrial Septal Defect Closure. Perspectives of Policymakers on Barriers to and Enablers of the Uptake of Cardiac Rehabilitation in Saudi Arabia: A Qualitative Study. Assessment of Coronary Collaterals Among Patients With ST-segment Elevation Myocardial Infarction Undergoing Primary Percutaneous Coronary Intervention and its Impact on In-hospital and 30-day Mortality: A Prospective Observational Study.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1