Removing the parachuting artifact using two-way scanning data in high-speed atomic force microscopy.

Shintaroh Kubo, Kenichi Umeda, Noriyuki Kodera, Shoji Takada
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引用次数: 2

Abstract

The high-speed atomic force microscopy (HS-AFM) is a unique and prominent method to observe structural dynamics of biomolecules at single molecule level at near-physiological condition. To achieve high temporal resolution, the probe tip scans the stage at high speed which can cause the so-called parachuting artifact in the HS-AFM images. Here, we develop a computational method to detect and remove the parachuting artifact in HS-AFM images using the two-way scanning data. To merge the two-way scanning images, we employed a method to infer the piezo hysteresis effect and to align the forward- and backward-scanning images. We then tested our method for HS-AFM videos of actin filaments, molecular chaperone, and duplex DNA. Together, our method can remove the parachuting artifact from the raw HS-AFM video containing two-way scanning data and make the processed video free from the parachuting artifact. The method is general and fast so that it can easily be applied to any HS-AFM videos with two-way scanning data.

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利用高速原子力显微镜的双向扫描数据去除跳伞伪影。
高速原子力显微镜(HS-AFM)是在近生理条件下单分子水平观察生物分子结构动力学的一种独特而突出的方法。为了获得高时间分辨率,探针尖端以高速扫描阶段,这可能会在HS-AFM图像中引起所谓的降落伞伪影。在这里,我们开发了一种利用双向扫描数据检测和去除HS-AFM图像中跳伞伪影的计算方法。为了融合双向扫描图像,我们采用了一种推断压电滞后效应的方法,并对前后扫描图像进行了对齐。然后,我们测试了我们的方法对肌动蛋白丝,分子伴侣和双链DNA的HS-AFM视频。同时,我们的方法可以从含有双向扫描数据的HS-AFM原始视频中去除空降伪影,使处理后的视频没有空降伪影。该方法通用性强,速度快,适用于任何具有双向扫描数据的HS-AFM视频。
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