时间分辨x射线数据分析的实际考虑。

Pub Date : 2023-07-01 DOI:10.1063/4.0000196
Marius Schmidt
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引用次数: 1

摘要

自硬x射线自由电子激光器(XFELs)问世以来,时间分辨大分子晶体学领域得到了迅速发展。从xfel收集和处理数据的技术传播到同步加速器光源。虽然时间尺度和数据收集方式在这些类型的光源之间可能有很大差异,但对所得x射线数据的分析基本上是沿着相同的途径进行的。一个成功的时间分辨实验的基础是一个包含化学意义信号的电子密度差图。如果不能得到这样的差分图,实验就失败了。本文提出了一种实用的方法来计算DED图并使用它们来确定结构模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Practical considerations for the analysis of time-resolved x-ray data.

The field of time-resolved macromolecular crystallography has been expanding rapidly after free electron lasers for hard x rays (XFELs) became available. Techniques to collect and process data from XFELs spread to synchrotron light sources. Although time-scales and data collection modalities can differ substantially between these types of light sources, the analysis of the resulting x-ray data proceeds essentially along the same pathway. At the base of a successful time-resolved experiment is a difference electron density (DED) map that contains chemically meaningful signal. If such a difference map cannot be obtained, the experiment has failed. Here, a practical approach is presented to calculate DED maps and use them to determine structural models.

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