G. Zhao, R. Joshi, V. Lakdawala, E. Schamiloglu, H. Hjalmarson
{"title":"脉冲条件下TiO2击穿的研究","authors":"G. Zhao, R. Joshi, V. Lakdawala, E. Schamiloglu, H. Hjalmarson","doi":"10.1109/CEIDP.2006.311941","DOIUrl":null,"url":null,"abstract":"Model studies of current conduction and breakdown in TiO2 were carried out. Our simulation results indicate that electrical breakdown of TiO2 under multiple pulsed conditions can occur at lower voltages as compared to quasi-DC biasing. This is in agreement with experimental data. The results are indicative of a cumulative effect. We hypothesize that the lower breakdown voltages observed in TiO2 under pulsed conditions, is a direct rise-time effect, coupled with cummulative detrapping.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Studies of TiO2 Breakdown Under Pulsed Conditions\",\"authors\":\"G. Zhao, R. Joshi, V. Lakdawala, E. Schamiloglu, H. Hjalmarson\",\"doi\":\"10.1109/CEIDP.2006.311941\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Model studies of current conduction and breakdown in TiO2 were carried out. Our simulation results indicate that electrical breakdown of TiO2 under multiple pulsed conditions can occur at lower voltages as compared to quasi-DC biasing. This is in agreement with experimental data. The results are indicative of a cumulative effect. We hypothesize that the lower breakdown voltages observed in TiO2 under pulsed conditions, is a direct rise-time effect, coupled with cummulative detrapping.\",\"PeriodicalId\":219099,\"journal\":{\"name\":\"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.2006.311941\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2006.311941","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Model studies of current conduction and breakdown in TiO2 were carried out. Our simulation results indicate that electrical breakdown of TiO2 under multiple pulsed conditions can occur at lower voltages as compared to quasi-DC biasing. This is in agreement with experimental data. The results are indicative of a cumulative effect. We hypothesize that the lower breakdown voltages observed in TiO2 under pulsed conditions, is a direct rise-time effect, coupled with cummulative detrapping.
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