改进了大型电子显微镜图像的配准

2009 IEEE International Symposium on Biomedical Imaging: From Nano to Macro Pub Date : 2009-06-28 DOI:10.1109/ISBI.2009.5193077

A. Akselrod-Ballin, David N. Bock, R. Reid, S. Warfield

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引用次数: 8

摘要

本文介绍了一种用于三维重建的电子显微镜图像对齐的新算法。该算法扩展了期望最大化-迭代最近点(EM-ICP)算法，从点匹配到补丁匹配。我们利用局部补丁特征来实现改进的配准。该方法应用于透射电子显微镜(TEM)图像的三维重建。我们在大型TEM图像上展示了结果，并表明我们的方法提高了对准精度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Improved registration for large electron microscopy images

In this paper we introduce a novel algorithm for alignment of Electron Microscopy images for 3D reconstruction. The algorithm extends the Expectation Maximization - Iterative Closest Points (EM-ICP) algorithm to go from point matching to patch matching. We utilize local patch characteristics to achieve improved registration. The method is applied to enable 3D reconstruction of Transmission Electron Microscopy (TEM) images. We demonstrate results on large TEM images and show the increased alignment accuracy of our approach.

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2009 IEEE International Symposium on Biomedical Imaging: From Nano to Macro

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