可观测性驱动的多模态线扫描相机校准

Jasprabhjit Mehami, Teresa Vidal-Calleja, A. Alempijevic
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引用次数: 0

摘要

多模态传感器,如高光谱线扫描和帧相机可以合并到一个单一的相机系统,使单个传感器的限制得到补偿。这些系统的校准对于确保一种模式的数据可以与另一种模式相关联至关重要。最著名的方法是捕获已知平面图案的多个测量值,然后通过非线性最小二乘来优化校准参数。优化参数的置信度取决于测量结果,而测量结果受到传感器硬件噪声的污染。了解这些噪声如何通过校准传递是至关重要的,特别是在处理依赖于测量来提取特征点的线扫描相机时。本文采用极大似然估计方法将测量噪声在校准过程中传播,使优化后的参数与不确定度估计相关联。不确定性使得主动校准算法得以发展,该算法利用可观测性选择性地选择图像,从而改进参数估计。该算法在模拟和硬件上进行了测试,然后与使用所有图像进行校准的朴素方法进行了比较。仿真结果表明,该算法的总归一化误差降低了26.4%,协方差迹线降低了46.8%。硬件实验的结果也显示了协方差迹的减少,表明了选择好的测量值对参数估计的重要性。
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Observability driven Multi-modal Line-scan Camera Calibration
Multi-modal sensors such as hyperspectral line-scan and frame cameras can be incorporated into a single camera system, enabling individual sensor limitations to be compensated. Calibration of such systems is crucial to ensure data from one modality can be related to the other. The best known approach is to capture multiple measurements of a known planar pattern, which are then used to optimize calibration parameters through non-linear least squares. The confidence in the optimized parameters is dependent on the measurements, which are contaminated by noise due to sensor hardware. Understanding how this noise transfers through the calibration is essential, especially when dealing with line-scan cameras that rely on measurements to extract feature points. This paper adopts a maximum likelihood estimation method for propagating measurement noise through the calibration, such that the optimized parameters are associated with an estimate of uncertainty. The uncertainty enables development of an active calibration algorithm, which uses observability to selectively choose images that improve parameter estimation. The algorithm is tested in both simulation and hardware, then compared to a naive approach that uses all images to calibrate. The simulation results for the algorithm show a drop of 26.4% in the total normalized error and 46.8% in the covariance trace. Results from the hardware experiments also show a decrease in the covariance trace, demonstrating the importance of selecting good measurements for parameter estimation.
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