Si(111)衬底退火Ga2O3薄膜的结构和光学性质

Hyoun-woo Kim, N. Kim, C. Lee
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引用次数: 6

摘要

采用金属有机化学气相沉积(MOCVD)技术,研究了在Si(111)衬底上生长的氧化镓Ga2O3薄膜的结构和光学性能,并在750 ~ 1050℃范围内进行了退火。非晶Ga2O3沉积后退火生成b相晶粒。光致发光光谱表明,退火后的Ga2O3薄膜在470 nm处有蓝绿色发射,在365 nm处有紫外发射。
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Structural and optical properties of annealed Ga2O3 films on Si(111) substrates
Abstract An investigation has been made into the structural and optical properties of gallium oxide Ga2O3 films grown on Si(111) substrates by the metal organic chemical vapour deposition (MOCVD) technique, and annealed in the temperature range 750–1050°C. Post-deposition annealing of amorphous Ga2O3 was found to generate b phase grains. Photoluminescence spectra indicated that the annealed Ga2O3 films had a blue-green emission at 470 nm and an ultraviolet emission at 365 nm.
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