The Dichotomy of Commonality versus Form Factor for O-level ATE

When gathering requirements for a new O-level tester, there are many reference sources to use as examples to help design a total solution. The first step is to start with what is being tested, that typically has most of the IO needed and will help in creating a test strategy. Next, one should look to examples of Military Depot ATE for field repair. Many strategies from Depots can be reused for flight Line. Most users would prefer if the O-level testers had the same look and feel as a Depot tester. Commonality is typically appreciated by the end-user and this comes in many different forms, with instrument and software commonality typically offering the highest return on investment. While striving for commonality, one place that cannot be common is the form factor. Having instrument and software commonality is in direct odds with meeting the needs for an O-level tester. A typical O-level tester requirement is to be either 1 or 2-person portable and must meet stringent environmental requirements. The dichotomy of commonality versus form factor causes an ATE vendor to spend a staggering amount of energy innovating towards a solution. This comes as there is a push within the industry for common support equipment that can be used across any number of platforms. There is an inherent advantage in providing a tester foundation that can be configured for a wide variety of UUTs while offering a similar software environment to the solutions provided at the depot level. An ATE vendor should aim to leverage their experience at the depot level to provide the highest quality O-level test solutions. This paper will explore strategies of how to maintain commonality for instruments and software while still being able to innovate on the tester configuration, form factor and environmental requirements.