{"title":"1位Σ - Δ调制器的测试与表征","authors":"K. Abbes, A. Hentati, M. Masmoudi","doi":"10.1109/SSD.2008.4632875","DOIUrl":null,"url":null,"abstract":"This paper presents a built-in self test (BIST) methodology to measure offset error and gain error of SigmaDelta modulator. This structure is made up of a generator of stimulus and an analyzer of response. We propose a digital technique for the test of static characteristics of the modulator. A memory based signal generator is presented which can concurrently produce test stimuli and reference signals. A first order SigmaDelta is evaluated and the simulation results show the static errors effect on the modulator bitstream output.","PeriodicalId":267264,"journal":{"name":"2008 5th International Multi-Conference on Systems, Signals and Devices","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Test and characterization of 1 bit Σ — Δ modulator\",\"authors\":\"K. Abbes, A. Hentati, M. Masmoudi\",\"doi\":\"10.1109/SSD.2008.4632875\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a built-in self test (BIST) methodology to measure offset error and gain error of SigmaDelta modulator. This structure is made up of a generator of stimulus and an analyzer of response. We propose a digital technique for the test of static characteristics of the modulator. A memory based signal generator is presented which can concurrently produce test stimuli and reference signals. A first order SigmaDelta is evaluated and the simulation results show the static errors effect on the modulator bitstream output.\",\"PeriodicalId\":267264,\"journal\":{\"name\":\"2008 5th International Multi-Conference on Systems, Signals and Devices\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 5th International Multi-Conference on Systems, Signals and Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SSD.2008.4632875\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 5th International Multi-Conference on Systems, Signals and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSD.2008.4632875","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test and characterization of 1 bit Σ — Δ modulator
This paper presents a built-in self test (BIST) methodology to measure offset error and gain error of SigmaDelta modulator. This structure is made up of a generator of stimulus and an analyzer of response. We propose a digital technique for the test of static characteristics of the modulator. A memory based signal generator is presented which can concurrently produce test stimuli and reference signals. A first order SigmaDelta is evaluated and the simulation results show the static errors effect on the modulator bitstream output.
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