一种基于sram的fpga在航天应用中检测-减轻-校正辐射诱发故障的新方法

Yanmei Li, Dongmei Li, Zhihua Wang
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引用次数: 21

摘要

在航空航天应用中,现场可编程门阵列(FPGA)以其简单和灵活的独特优势而备受青睐。但是,辐射引起的故障,特别是单事件干扰(seu),可能会对基于sram的fpga甚至整个系统造成严重的破坏。为了抑制seu的影响,使系统从辐射故障中恢复,本文介绍了一种基于XC4000系列fpga的分层检测-缓解-校正方法。包括故障识别与缓解、软故障判断与纠正、硬故障定位与旁路等技术。通过实验和仿真验证了该方法的有效性。这种检测-缓解-校正方法可以覆盖几乎所有由辐射引起的软故障和硬故障,并在不中断整个系统正常运行的情况下减轻一般基于sram的fpga的seu的影响。
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A new approach to detect-mitigate-correct radiation-induced faults for SRAM-based FPGAs in aerospace application
In aerospace applications, the Field Programmable Gate Array (FPGA) is attractive for its distinct advantages - simplicity and flexibility. But radiation-induced faults, especially Single Event Upsets (SEUs), may cause serious damage to SRAM-based FPGAs and even to the whole system. To restrain the consequences of SEUs and recover the system from radiation-induced faults, a hierarchical detection-mitigation-correction methodology based on XC4000 series FPGAs is introduced in this paper. The following techniques are included: fault identification and mitigation, soft-fault judgement and correction, hard-fault location and bypass. The effectiveness of our approach is proved through experiment and simulation. Such a detection-mitigation-correction methodology can cover almost all radiation-induced soft and hard faults and mitigate the effects of SEUs for general SRAM-based FPGAs without interrupting normal operations of the whole system.
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