{"title":"一种基于sram的fpga在航天应用中检测-减轻-校正辐射诱发故障的新方法","authors":"Yanmei Li, Dongmei Li, Zhihua Wang","doi":"10.1109/NAECON.2000.894965","DOIUrl":null,"url":null,"abstract":"In aerospace applications, the Field Programmable Gate Array (FPGA) is attractive for its distinct advantages - simplicity and flexibility. But radiation-induced faults, especially Single Event Upsets (SEUs), may cause serious damage to SRAM-based FPGAs and even to the whole system. To restrain the consequences of SEUs and recover the system from radiation-induced faults, a hierarchical detection-mitigation-correction methodology based on XC4000 series FPGAs is introduced in this paper. The following techniques are included: fault identification and mitigation, soft-fault judgement and correction, hard-fault location and bypass. The effectiveness of our approach is proved through experiment and simulation. Such a detection-mitigation-correction methodology can cover almost all radiation-induced soft and hard faults and mitigate the effects of SEUs for general SRAM-based FPGAs without interrupting normal operations of the whole system.","PeriodicalId":171131,"journal":{"name":"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"A new approach to detect-mitigate-correct radiation-induced faults for SRAM-based FPGAs in aerospace application\",\"authors\":\"Yanmei Li, Dongmei Li, Zhihua Wang\",\"doi\":\"10.1109/NAECON.2000.894965\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In aerospace applications, the Field Programmable Gate Array (FPGA) is attractive for its distinct advantages - simplicity and flexibility. But radiation-induced faults, especially Single Event Upsets (SEUs), may cause serious damage to SRAM-based FPGAs and even to the whole system. To restrain the consequences of SEUs and recover the system from radiation-induced faults, a hierarchical detection-mitigation-correction methodology based on XC4000 series FPGAs is introduced in this paper. The following techniques are included: fault identification and mitigation, soft-fault judgement and correction, hard-fault location and bypass. The effectiveness of our approach is proved through experiment and simulation. Such a detection-mitigation-correction methodology can cover almost all radiation-induced soft and hard faults and mitigate the effects of SEUs for general SRAM-based FPGAs without interrupting normal operations of the whole system.\",\"PeriodicalId\":171131,\"journal\":{\"name\":\"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NAECON.2000.894965\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.2000.894965","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new approach to detect-mitigate-correct radiation-induced faults for SRAM-based FPGAs in aerospace application
In aerospace applications, the Field Programmable Gate Array (FPGA) is attractive for its distinct advantages - simplicity and flexibility. But radiation-induced faults, especially Single Event Upsets (SEUs), may cause serious damage to SRAM-based FPGAs and even to the whole system. To restrain the consequences of SEUs and recover the system from radiation-induced faults, a hierarchical detection-mitigation-correction methodology based on XC4000 series FPGAs is introduced in this paper. The following techniques are included: fault identification and mitigation, soft-fault judgement and correction, hard-fault location and bypass. The effectiveness of our approach is proved through experiment and simulation. Such a detection-mitigation-correction methodology can cover almost all radiation-induced soft and hard faults and mitigate the effects of SEUs for general SRAM-based FPGAs without interrupting normal operations of the whole system.