{"title":"器件匹配中双侧鳍线阻抗的实验评估","authors":"H. A. Willing, B. Spielman","doi":"10.1109/MWSYM.1981.1129836","DOIUrl":null,"url":null,"abstract":"This paper describes the results of an experimental investigation of bilateral fin-line impedance characteristics for matching to small-chip devices. The results from two different experimental approaches are presented and compared with computed results.","PeriodicalId":120372,"journal":{"name":"1981 IEEE MTT-S International Microwave Symposium Digest","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Experimental Assessment of Bilateral Fin-Line Impedance for Device Matching\",\"authors\":\"H. A. Willing, B. Spielman\",\"doi\":\"10.1109/MWSYM.1981.1129836\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the results of an experimental investigation of bilateral fin-line impedance characteristics for matching to small-chip devices. The results from two different experimental approaches are presented and compared with computed results.\",\"PeriodicalId\":120372,\"journal\":{\"name\":\"1981 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1981 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1981.1129836\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1981 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1981.1129836","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experimental Assessment of Bilateral Fin-Line Impedance for Device Matching
This paper describes the results of an experimental investigation of bilateral fin-line impedance characteristics for matching to small-chip devices. The results from two different experimental approaches are presented and compared with computed results.
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