{"title":"测试物联网系统","authors":"J. Voas, D. R. Kuhn, P. Laplante","doi":"10.1109/SOSE.2018.00015","DOIUrl":null,"url":null,"abstract":"This article presents challenges and solutions to testing systems based on the underlying products and services commonly referred to as the Internet of ‘things’ (IoT).","PeriodicalId":414464,"journal":{"name":"2018 IEEE Symposium on Service-Oriented System Engineering (SOSE)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Testing IoT Systems\",\"authors\":\"J. Voas, D. R. Kuhn, P. Laplante\",\"doi\":\"10.1109/SOSE.2018.00015\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents challenges and solutions to testing systems based on the underlying products and services commonly referred to as the Internet of ‘things’ (IoT).\",\"PeriodicalId\":414464,\"journal\":{\"name\":\"2018 IEEE Symposium on Service-Oriented System Engineering (SOSE)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-03-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Symposium on Service-Oriented System Engineering (SOSE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOSE.2018.00015\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Symposium on Service-Oriented System Engineering (SOSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOSE.2018.00015","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This article presents challenges and solutions to testing systems based on the underlying products and services commonly referred to as the Internet of ‘things’ (IoT).
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