{"title":"HBC熔断器的计算机建模及其与电力电子设备在正弦和非正弦短路故障条件下的配合","authors":"F. Magnago, P. M. McEwan","doi":"10.1109/APEC.1995.469011","DOIUrl":null,"url":null,"abstract":"Electro-thermal models for HBC fuses and power electronic (PE) switching devices, based on the SPICE simulator and device manufacturers conventional test data, are introduced. The simulations permit coordination of fuse-PE device protection, under sinusoidal and nonsinusoidal short-circuit fault conditions, based on computing PE device junction temperature. Simulations of conventional fuse short-circuit symmetrical AC faults are compared with results obtained from short-circuit tests. Results are also given for a three-phase half-wave rectifier as an example application of the methodology for nonsinusoidal circuits and faults.<<ETX>>","PeriodicalId":335367,"journal":{"name":"Proceedings of 1995 IEEE Applied Power Electronics Conference and Exposition - APEC'95","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Computer modelling of HBC fuses and their co-ordination with power electronic devices for sinusoidal and non-sinusoidal short-circuit fault conditions\",\"authors\":\"F. Magnago, P. M. McEwan\",\"doi\":\"10.1109/APEC.1995.469011\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electro-thermal models for HBC fuses and power electronic (PE) switching devices, based on the SPICE simulator and device manufacturers conventional test data, are introduced. The simulations permit coordination of fuse-PE device protection, under sinusoidal and nonsinusoidal short-circuit fault conditions, based on computing PE device junction temperature. Simulations of conventional fuse short-circuit symmetrical AC faults are compared with results obtained from short-circuit tests. Results are also given for a three-phase half-wave rectifier as an example application of the methodology for nonsinusoidal circuits and faults.<<ETX>>\",\"PeriodicalId\":335367,\"journal\":{\"name\":\"Proceedings of 1995 IEEE Applied Power Electronics Conference and Exposition - APEC'95\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-03-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1995 IEEE Applied Power Electronics Conference and Exposition - APEC'95\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEC.1995.469011\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 IEEE Applied Power Electronics Conference and Exposition - APEC'95","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.1995.469011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Computer modelling of HBC fuses and their co-ordination with power electronic devices for sinusoidal and non-sinusoidal short-circuit fault conditions
Electro-thermal models for HBC fuses and power electronic (PE) switching devices, based on the SPICE simulator and device manufacturers conventional test data, are introduced. The simulations permit coordination of fuse-PE device protection, under sinusoidal and nonsinusoidal short-circuit fault conditions, based on computing PE device junction temperature. Simulations of conventional fuse short-circuit symmetrical AC faults are compared with results obtained from short-circuit tests. Results are also given for a three-phase half-wave rectifier as an example application of the methodology for nonsinusoidal circuits and faults.<>