{"title":"用于测试模拟电路的电源电流监测器原型","authors":"M. Al-Qutayri, W. Tenten, P. Shepherd","doi":"10.1109/ASIC.1997.616974","DOIUrl":null,"url":null,"abstract":"This paper presents the design of a unified supply current monitor for the detection of faults in analogue circuits. The emphasis is placed on the design of a monitor with minimum overhead that can be implemented to detect variations in the dynamic supply current. The design of the monitor and the results of using it to detect faults in an analogue circuit in a simulation environment are outlined.","PeriodicalId":300310,"journal":{"name":"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A prototype supply current monitor for testing analogue circuits\",\"authors\":\"M. Al-Qutayri, W. Tenten, P. Shepherd\",\"doi\":\"10.1109/ASIC.1997.616974\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the design of a unified supply current monitor for the detection of faults in analogue circuits. The emphasis is placed on the design of a monitor with minimum overhead that can be implemented to detect variations in the dynamic supply current. The design of the monitor and the results of using it to detect faults in an analogue circuit in a simulation environment are outlined.\",\"PeriodicalId\":300310,\"journal\":{\"name\":\"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)\",\"volume\":\"82 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1997.616974\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1997.616974","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A prototype supply current monitor for testing analogue circuits
This paper presents the design of a unified supply current monitor for the detection of faults in analogue circuits. The emphasis is placed on the design of a monitor with minimum overhead that can be implemented to detect variations in the dynamic supply current. The design of the monitor and the results of using it to detect faults in an analogue circuit in a simulation environment are outlined.
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