采用电容源退化技术的宽带互补CMOS压控振荡器

M. Wei, R. Negra, Sheng-Fuh Chang, Chih-Sheng Chen
{"title":"采用电容源退化技术的宽带互补CMOS压控振荡器","authors":"M. Wei, R. Negra, Sheng-Fuh Chang, Chih-Sheng Chen","doi":"10.1109/EUROCON.2017.8011121","DOIUrl":null,"url":null,"abstract":"This paper demonstrates a wideband complementary LC-VCO using capacitive-source-degeneration (CSD) technique for WiFi and LTE applications. A cross-coupling pair is required to generate suitable-gm but the parasitic capacitance of the pair leads to a reduction of capacitance ratio of varactors and thus, tuning range of a VCO. Properly designing source-degeneration capacitance can relieve this reduction and optimum capacitance is discussed in this paper. The chip is fabricated in 180 nm CMOS and has a chip area of 0.43 mm2. The measured oscillation frequency is from 2.22 GHz to 2.94 GHz (27.9 %) and the lowest phase noise is −122.5 dBc/Hz at 1MHz offset at 2.87 GHz. The core power dissipation is 3.6 mW from a supply voltage of 1.8 V and FOM of −186 dBc/Hz is achieved.","PeriodicalId":114100,"journal":{"name":"IEEE EUROCON 2017 -17th International Conference on Smart Technologies","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Wideband complementary CMOS VCO with capacitive-source-degeneration technique\",\"authors\":\"M. Wei, R. Negra, Sheng-Fuh Chang, Chih-Sheng Chen\",\"doi\":\"10.1109/EUROCON.2017.8011121\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper demonstrates a wideband complementary LC-VCO using capacitive-source-degeneration (CSD) technique for WiFi and LTE applications. A cross-coupling pair is required to generate suitable-gm but the parasitic capacitance of the pair leads to a reduction of capacitance ratio of varactors and thus, tuning range of a VCO. Properly designing source-degeneration capacitance can relieve this reduction and optimum capacitance is discussed in this paper. The chip is fabricated in 180 nm CMOS and has a chip area of 0.43 mm2. The measured oscillation frequency is from 2.22 GHz to 2.94 GHz (27.9 %) and the lowest phase noise is −122.5 dBc/Hz at 1MHz offset at 2.87 GHz. The core power dissipation is 3.6 mW from a supply voltage of 1.8 V and FOM of −186 dBc/Hz is achieved.\",\"PeriodicalId\":114100,\"journal\":{\"name\":\"IEEE EUROCON 2017 -17th International Conference on Smart Technologies\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE EUROCON 2017 -17th International Conference on Smart Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUROCON.2017.8011121\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE EUROCON 2017 -17th International Conference on Smart Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROCON.2017.8011121","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

本文演示了一种宽带互补LC-VCO,使用电容源退化(CSD)技术用于WiFi和LTE应用。交叉耦合对需要产生合适的耦合,但耦合对的寄生电容导致变容管的电容比减小,从而降低了压控振荡器的调谐范围。合理设计源退化电容可以缓解这种衰减,并对最佳电容进行了讨论。该芯片采用180nm CMOS工艺制造,芯片面积为0.43 mm2。测量的振荡频率范围为2.22 ~ 2.94 GHz(27.9%),在2.87 GHz的1MHz偏移处,最低相位噪声为- 122.5 dBc/Hz。电源电压为1.8 V时,核心功耗为3.6 mW, FOM为−186 dBc/Hz。
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Wideband complementary CMOS VCO with capacitive-source-degeneration technique
This paper demonstrates a wideband complementary LC-VCO using capacitive-source-degeneration (CSD) technique for WiFi and LTE applications. A cross-coupling pair is required to generate suitable-gm but the parasitic capacitance of the pair leads to a reduction of capacitance ratio of varactors and thus, tuning range of a VCO. Properly designing source-degeneration capacitance can relieve this reduction and optimum capacitance is discussed in this paper. The chip is fabricated in 180 nm CMOS and has a chip area of 0.43 mm2. The measured oscillation frequency is from 2.22 GHz to 2.94 GHz (27.9 %) and the lowest phase noise is −122.5 dBc/Hz at 1MHz offset at 2.87 GHz. The core power dissipation is 3.6 mW from a supply voltage of 1.8 V and FOM of −186 dBc/Hz is achieved.
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