用于测量光纤色散特性的白光光谱干涉法

P. Hlubina, T. Martynkien, W. Urbańczyk
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引用次数: 0

摘要

采用一种新的光谱域白光干涉技术,利用低分辨率光谱仪测量双模光纤的色散特性。该技术利用了这样一个事实,即光谱干涉条纹在补偿(非色散)迈克尔逊干涉仪和双模光纤的串联配置的输出处被分辨,只有在所谓的均衡波长附近,干涉仪中的光程差(OPD)与多模群OPD相同。利用白光光谱干涉技术测量了椭圆芯(高双折射)光纤中模式传播常数差和多模群OPD的光谱依赖性。利用光纤的已知参数,将光纤的色散特性与相应的理论分析结果进行了比较。
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White-light spectral interferometry used to measure dispersion characteristics of optical fibers
A new spectral-domain white-light interferometric technique employing a low-resolution spectrometer is used to measure dispersion characteristics of two-mode optical fibers. The technique utilizes the fact that the spectral interference fringes are resolved at the output of a tandem configuration of the compensated (non-dispersive) Michelson interferometer and a two-mode optical fiber only in the vicinities of so-called equalization wavelengths at which the optical path difference (OPD) in the interferometer is the same as the intermodal group OPDs. The white-light spectral interferometric technique is used to measure the spectral dependences of both the differences between propagation constants of modes and the intermodal group OPD for elliptical-core (highly birefringent) optical fibers. The measured dispersion characteristics of the optical fibers are compared with those corresponding to the results of an adequate theoretical analysis using the known parameters of the optical fibers.
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