基于硅CMOS和BiCMOS技术的准光学太赫兹器件

D. But, I. Morkunaitė, Y. Ivonyak, C. Kołaciński, K. Ikamas, W. Knap, A. Lisauskas
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引用次数: 0

摘要

本文报告了我们在太赫兹频率范围内基于cmos的电子源和探测器的最新进展以及实际应用的例子。所提出的准光发射-探测器对系统工作在200 ~ 266ghz范围内,在1 Hz等效噪声带宽的直接检测范围内,输入功率相关的信噪比超过70 dB。它结合了基于CMOS场效应晶体管的高性能探测器和采用65纳米CMOS或130纳米BiCMOS制造工艺提供的Si或SiGe双极晶体管的压控振荡器。
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Quasi-optical Terahertz Devices Based on Silicon in CMOS and BiCMOS Technology
This paper reports on our recent advances in CMOS-based electronic sources and detectors developed for the terahertz frequency range and examples of practical applications. The presented quasi-optical emitter-detector pair systems operate in the 200 - 266 GHz range exhibiting input power-related signal-to-noise ratio exceeding 70 dB in the direct detection regime for one Hz equivalent noise bandwidth. It combines a high-performance detector based on CMOS field-effect transistors and a voltage-controlled oscillator employing Si or SiGe bipolar transistors provided by the 65 nm CMOS or 130 nm BiCMOS fabrication processes.
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