用压电伺服系统检测LED微结构

Yi-Cheng Huang, K. Chuang, Mou-Sheng Lin, Chi-Fan Chen
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引用次数: 12

摘要

本文的目的是为当前快速发展的LED(发光二极管)光电工业开发检测系统。为应对下一代加工尺寸的缩小,超精密、快速检测规格的检测设备的齿轮将成为重要的研究重点之一。本文提出了一种机器视觉系统,通过压电驱动平台检测LED微结构,实现视觉系统对平面电机的反馈控制。利用压电致动器(PEA)嵌入探测级的特点,实现了对LED衬垫/晶片的超精密快速定位。利用前馈神经网络(FFNN)学习算法补偿压电的非线性和滞后特性,对压电驱动的探测台进行控制。实验结果表明,每个LED衬垫/芯片可以在一个探头每秒4片的速度内完成照明。这项工作验证了一种新的检测机结构,并证明了未来在低维制造中多探头的可行性。
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Inspecting LED micro structure by piezo servo system
The aim of this paper is to develop the detection system for present fast-developing LED (light emitted diode) photoelectric industry. To cope with the processing size of next generation dwindles, the gear of the inspection equipment in ultra precision and fast inspection specifications will become one of the important research keys. This paper presents a machine vision to inspect LED microstructure by piezo-actuation stage, while implemented vision system is used for feedback control of the planar motor. Ultra precision and fast positioning for searching the LED pad/die is achieved by using the features of piezoelectric actuator (PEA) that is embedded in the probing stage. Such piezo-actuated probing stage is controlled by using feed-forward neural network (FFNN) learning algorithm to compensate for the nonlinear and hysteresis properties of piezoelectricity. Experimental results show each LED pad/die can be finished lighting within the rate of 4 pieces per second of one probe. This work validates a new inspection machine structure and demonstrates the feasibility on future multi probes for next manufacturing in lower dimensions.
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