{"title":"用于生产可靠电力电子产品的老化技术综述","authors":"O. Bormanis, L. Ribickis","doi":"10.1109/RTUCON48111.2019.8982357","DOIUrl":null,"url":null,"abstract":"Role of burn-in in the life cycle of power electronics assemblies is discussed in this paper. Differences between burn-in and other production screening methods are highlighted. This paper reviews burn-in testing as a part of production reliability improvement program discussing its benefits and challenges.","PeriodicalId":317349,"journal":{"name":"2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Review of Burn-In for Production of Reliable Power Electronic Applications\",\"authors\":\"O. Bormanis, L. Ribickis\",\"doi\":\"10.1109/RTUCON48111.2019.8982357\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Role of burn-in in the life cycle of power electronics assemblies is discussed in this paper. Differences between burn-in and other production screening methods are highlighted. This paper reviews burn-in testing as a part of production reliability improvement program discussing its benefits and challenges.\",\"PeriodicalId\":317349,\"journal\":{\"name\":\"2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RTUCON48111.2019.8982357\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RTUCON48111.2019.8982357","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Review of Burn-In for Production of Reliable Power Electronic Applications
Role of burn-in in the life cycle of power electronics assemblies is discussed in this paper. Differences between burn-in and other production screening methods are highlighted. This paper reviews burn-in testing as a part of production reliability improvement program discussing its benefits and challenges.
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