基于有限元分析的梅花接触温度场仿真分析

Dacai Chen, Tian F. Lai, Xue Chen, Jiyu Li, Nuo-Fu Chen
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摘要

梅花触点作为开关柜不可缺少的一部分,会影响设备的安全稳定运行。梅花触点的长期高温运行将极大地影响设备的使用寿命。本文采用实际测量与有限元分析相结合的方法,对630A/12片和630A/24片的昆孔触点的温升进行了计算,并对两种不同类型的昆孔触点的性能进行了分析比较。仿真结果表明,12个接触手指的梅花触点的最高温升为51.5℃,24个接触手指的梅花触点的最高温升为64.4℃。在实际测试中,12指接触梅花触点的最高温升为56.9℃,24指接触梅花触点的最高温升为62.4℃。与接触手指越少,温升越低的经验不同,接触手指越多的梅花接触产生的温升更高。从另一个角度来看,这一结果可能是由于在相同半径下,接触手指较多的梅花接触受到的弹簧压力较小,接触阻力的增加导致热效应更明显。这也说明在增加接触手指时,也要考虑接触电阻对温度的影响。
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Simulation Analysis of Plum Blossom Contact Temperature Field Based on Finite Element Analysis
As an indispensable part of the switch cabinet, the plum blossom contact will affect the safe and stable operation of the equipment. The long-term high temperature operation of the plum blossom contact will greatly affect the service life of the equipment. In this paper, the temperature rising of 630A/12-piece and 630A/24-piece quincunx contacts are calculated by combining actual measurement and finite element analysis, and the performance of two different types of quincunx contacts is analyzed and compared. The simulation results show that the maximum temperature rise of the plum blossom contacts of 12 contact fingers is 51.5°C, and the maximum temperature of the plum blossom contacts of 24 contact fingers is 64.4 °C. In the actual test, the maximum temperature rise of the plum blossom contacts with 12 contact fingers is 56.9 °C, and the maximum temperature of the plum blossom contacts with 24 contact fingers is 62.4 °C. Different from the experience that the fewer the contact fingers, the lower the temperature rise, the plum blossom contact with more contact fingers produces a higher temperature rise. From another point of view, this result may be due to the fact that under the same radius, the plum blossom contact with more contact fingers receives less spring pressure, and the increase in contact resistance leads to a more obvious thermal effect. This also shows that the influence of contact resistance on temperature should also be considered when the contact fingers are increased.
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