{"title":"离子线性测量使用六端口网络分析仪","authors":"C. Gingras, R. Bosisio","doi":"10.1109/ARFTG.1988.323916","DOIUrl":null,"url":null,"abstract":"The six-port junction has already proven to be very useful in small-signal measurements of multi-port networks. The aim of this paper is to demonstrate that it can also be used to determine equivalent non-linear circuit models of selected components, through measurements only at the fundamental frequency. The examples taken are packaged PIN and varactor diodes. Small-signal measurements are presented together with the plan to obtain optimized linear and non-linear models.","PeriodicalId":235867,"journal":{"name":"32nd ARFTG Conference Digest","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ion-Linear Measurements Using Six-Port Network Analyzer\",\"authors\":\"C. Gingras, R. Bosisio\",\"doi\":\"10.1109/ARFTG.1988.323916\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The six-port junction has already proven to be very useful in small-signal measurements of multi-port networks. The aim of this paper is to demonstrate that it can also be used to determine equivalent non-linear circuit models of selected components, through measurements only at the fundamental frequency. The examples taken are packaged PIN and varactor diodes. Small-signal measurements are presented together with the plan to obtain optimized linear and non-linear models.\",\"PeriodicalId\":235867,\"journal\":{\"name\":\"32nd ARFTG Conference Digest\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"32nd ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1988.323916\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"32nd ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1988.323916","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ion-Linear Measurements Using Six-Port Network Analyzer
The six-port junction has already proven to be very useful in small-signal measurements of multi-port networks. The aim of this paper is to demonstrate that it can also be used to determine equivalent non-linear circuit models of selected components, through measurements only at the fundamental frequency. The examples taken are packaged PIN and varactor diodes. Small-signal measurements are presented together with the plan to obtain optimized linear and non-linear models.
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