Discretization of optical properties in symmetrical nanofilm-structures

Based on microscopic (exciton) theory of optical properties of symmetrically perturbed ultrathin molecular films, the absorption, reflection and transparency indices were formulated and presented in the function of frequencies of external electromagnetic field in near infrared (IR) region. It has been showed that all optical properties depend on the position of the crystal plane with regard on boundary planes of the film. We have determined and analyzed optical properties relations for the whole film structure based on the consideration for multiple reflection, absorption and transparency in those multilayered structure. The three-layered dielectric nanofilms with different boundary conditions on surfaces were analyzed and some discrete resonant absorption lines were obtained. Their number, position and distribution depend on the boundary parameter values, i.e. on the type and the technological process of their preparation/fabrication. Practically monochromatic absorption may occur. Unlike the corresponding bulk-samples which are total absorbers throughout the near IR region, in ultrathin films will appear selective and discrete reflection and transparency too. These results could give a great contribution in optical engineering of nanostructures, especially in technology of designing of new electronic and photonic equipment, and for nanoparticles construction for drug carrier/delivery in nano-medicine.