{"title":"模拟电路故障诊断:数据驱动方法","authors":"A. Zhirabok, A. Baranov","doi":"10.1109/PC.2013.6581389","DOIUrl":null,"url":null,"abstract":"The paper is devoted to the problem of fault detection in analog electrical circuits described by linear or nonlinear polynomial models. So-called data-driven method for fault detection is considered. This method assumes that parameters of the circuit under consideration may be unknown. It does not use methods of identification and allows checking whether or not parameters of some elements deviate considerably from their nominal values.","PeriodicalId":232418,"journal":{"name":"2013 International Conference on Process Control (PC)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Fault diagnosis in analog electrical circuits: data-driven method\",\"authors\":\"A. Zhirabok, A. Baranov\",\"doi\":\"10.1109/PC.2013.6581389\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper is devoted to the problem of fault detection in analog electrical circuits described by linear or nonlinear polynomial models. So-called data-driven method for fault detection is considered. This method assumes that parameters of the circuit under consideration may be unknown. It does not use methods of identification and allows checking whether or not parameters of some elements deviate considerably from their nominal values.\",\"PeriodicalId\":232418,\"journal\":{\"name\":\"2013 International Conference on Process Control (PC)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-06-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 International Conference on Process Control (PC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PC.2013.6581389\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Process Control (PC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PC.2013.6581389","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault diagnosis in analog electrical circuits: data-driven method
The paper is devoted to the problem of fault detection in analog electrical circuits described by linear or nonlinear polynomial models. So-called data-driven method for fault detection is considered. This method assumes that parameters of the circuit under consideration may be unknown. It does not use methods of identification and allows checking whether or not parameters of some elements deviate considerably from their nominal values.