{"title":"EROS加速器真空部分的功率流","authors":"A. Jones, A. Stevens, J. Threadgold","doi":"10.1109/PPPS.2007.4651963","DOIUrl":null,"url":null,"abstract":"Used to conduct research into the intense flash x-ray source, the self-magnetic pinch diode[1], EROS [2] delivers approximately 100kA across a 4MV gap with a 150ns pulselength. Prior to reaching the load, this power flow enters a vacuum region where intense electric fields cause electron emission from many of the metal surfaces; these electrons are then subject to intense electromagnetic fields. Included are 2D particle in cell models of the electron power flow outside the diode and comparison with electrical diagnostics.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"119 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Power flow in the vacuum section of the EROS accelerator\",\"authors\":\"A. Jones, A. Stevens, J. Threadgold\",\"doi\":\"10.1109/PPPS.2007.4651963\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Used to conduct research into the intense flash x-ray source, the self-magnetic pinch diode[1], EROS [2] delivers approximately 100kA across a 4MV gap with a 150ns pulselength. Prior to reaching the load, this power flow enters a vacuum region where intense electric fields cause electron emission from many of the metal surfaces; these electrons are then subject to intense electromagnetic fields. Included are 2D particle in cell models of the electron power flow outside the diode and comparison with electrical diagnostics.\",\"PeriodicalId\":275106,\"journal\":{\"name\":\"2007 16th IEEE International Pulsed Power Conference\",\"volume\":\"119 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 16th IEEE International Pulsed Power Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PPPS.2007.4651963\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 16th IEEE International Pulsed Power Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PPPS.2007.4651963","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power flow in the vacuum section of the EROS accelerator
Used to conduct research into the intense flash x-ray source, the self-magnetic pinch diode[1], EROS [2] delivers approximately 100kA across a 4MV gap with a 150ns pulselength. Prior to reaching the load, this power flow enters a vacuum region where intense electric fields cause electron emission from many of the metal surfaces; these electrons are then subject to intense electromagnetic fields. Included are 2D particle in cell models of the electron power flow outside the diode and comparison with electrical diagnostics.