Legacy test program sets migration using fault modeling and dynamic reasoning

The electronics industry and the Department of Defense (DoD), has thousands of obsolete legacy automated test systems (ATS). There are many systems, with different hardware and software architectures, that cannot be upgraded. The inability to reliably test products, diagnose faults, and collect historical data is having an effect on mission readiness. This paper describes a test and diagnostic system model that provides a means to use historical test and repair data from all levels of operation. The process reduces rework costs and decreases maintenance and repair costs through earlier and more accurate fault isolation. This work recoups the efforts of the original developer and captures test and diagnostic knowledge for the future. Consequently, the concept has been proposed for implementation within the Army ATS/TPS centers for use at the Army maintenance depots. Additional benefits from this work: development of a reliability database for system, subsystem, component by test type and ATS; tracking system reliability and mission performance data for use in developing requirements for new or upgrade system procurement specifications; and for pushing diagnostic knowledge and support from the sustainment level to the field and vice versa. The work presented will change the process of developing, maintaining and migrating diagnostic test now and into the future.