{"title":"第八届ACM SIGSOFT自动化软件测试国际研讨会论文集","authors":"T. Vos, Sigrid Eldh, Wishnu Prasetya","doi":"10.1145/3121245","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":107820,"journal":{"name":"Proceedings of the 8th ACM SIGSOFT International Workshop on Automated Software Testing","volume":"10 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Proceedings of the 8th ACM SIGSOFT International Workshop on Automated Software Testing\",\"authors\":\"T. Vos, Sigrid Eldh, Wishnu Prasetya\",\"doi\":\"10.1145/3121245\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":107820,\"journal\":{\"name\":\"Proceedings of the 8th ACM SIGSOFT International Workshop on Automated Software Testing\",\"volume\":\"10 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 8th ACM SIGSOFT International Workshop on Automated Software Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3121245\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 8th ACM SIGSOFT International Workshop on Automated Software Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3121245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}