{"title":"光盘衬底应力双折射的测量","authors":"Xishan Li, Wendong Xu, Li Zhu","doi":"10.1117/12.248714","DOIUrl":null,"url":null,"abstract":"The theory and experimental analysis has been made in this paper for the change of phase retardation in optical disk substrates when light beams pass through them from different incident angles. We tested the PC and glass substrate by using a polarization phase modulation method with Polarizer- Modulation-Compensator-Specimen-Analyzer structure.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1996-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurement of stress birefringence in optical disk substrates\",\"authors\":\"Xishan Li, Wendong Xu, Li Zhu\",\"doi\":\"10.1117/12.248714\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The theory and experimental analysis has been made in this paper for the change of phase retardation in optical disk substrates when light beams pass through them from different incident angles. We tested the PC and glass substrate by using a polarization phase modulation method with Polarizer- Modulation-Compensator-Specimen-Analyzer structure.\",\"PeriodicalId\":212484,\"journal\":{\"name\":\"Optical Storage and Information Data Storage\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-09-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Storage and Information Data Storage\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.248714\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Storage and Information Data Storage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.248714","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of stress birefringence in optical disk substrates
The theory and experimental analysis has been made in this paper for the change of phase retardation in optical disk substrates when light beams pass through them from different incident angles. We tested the PC and glass substrate by using a polarization phase modulation method with Polarizer- Modulation-Compensator-Specimen-Analyzer structure.
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