{"title":"基于环的压控振荡器中的模拟并行性","authors":"Daeik D. Kim, Choongyeun Cho, Jonghae Kim","doi":"10.1145/1391469.1391557","DOIUrl":null,"url":null,"abstract":"The performance advantages in parallel ring-based VCOs are explored. When the number of VCOs is doubled, the parallel VCOs enhance phase noise by 3 dB, and the within-chip process-induced variation is reduced by 3 dB, which improves chip-limited yield. The parallel VCOs trade off circuit area and power in exchange. The parallelism advantages in analog and digital systems are compared.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Analog parallelism in ring-based VCOs\",\"authors\":\"Daeik D. Kim, Choongyeun Cho, Jonghae Kim\",\"doi\":\"10.1145/1391469.1391557\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The performance advantages in parallel ring-based VCOs are explored. When the number of VCOs is doubled, the parallel VCOs enhance phase noise by 3 dB, and the within-chip process-induced variation is reduced by 3 dB, which improves chip-limited yield. The parallel VCOs trade off circuit area and power in exchange. The parallelism advantages in analog and digital systems are compared.\",\"PeriodicalId\":412696,\"journal\":{\"name\":\"2008 45th ACM/IEEE Design Automation Conference\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-06-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 45th ACM/IEEE Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1391469.1391557\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 45th ACM/IEEE Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1391469.1391557","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The performance advantages in parallel ring-based VCOs are explored. When the number of VCOs is doubled, the parallel VCOs enhance phase noise by 3 dB, and the within-chip process-induced variation is reduced by 3 dB, which improves chip-limited yield. The parallel VCOs trade off circuit area and power in exchange. The parallelism advantages in analog and digital systems are compared.