真空灭弧器中被金属蒸气污染的氧化铝陶瓷的闪络电压

S. Sato, H. Koga
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引用次数: 4

摘要

讨论了真空灭弧器陶瓷表面金属蒸气污染对表面闪络特性的影响。首先,利用金属气相发射fmm CuCr触点,制备了表面电阻率(p)为102-1015 Ω的圆盘状氧化铝(A1203,)陶瓷样品,并测量了其表面闪蒸电压。发现雷电脉冲闪络电压随p的减小而减小,当p < 1012 Ω时,闪络电压的调理效应和散射都变小。其次,我们制作了两种类型的VIS,分别是CuCr螺旋触点和CuCr轴向磁场触点,以20-40 kArms进行40次短路电流中断。结果表明,具有螺旋触点的VI陶瓷的pf降低到104 Ω,并且VI端子之间的击穿电压也降低了。具有AMF触点的VI的击穿电压没有降低。
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Flashover voltage of alumina ceramic contaminated by metal vapor in vacuum interrupters
We have discussed the influence of metal vapor contamination for ceramic surface of vacuum interrupters (VIS) on surface flashover characteristics. Firstly, using the metal vapor emission fmm CuCr contacts, we produced disk-shape alumina (A1203,) ceramic samples with surface resistivity (p) of 102-1015 Ω, and measured their surface flashover voltages. It was identified that lightening impulse flashover voltage decreased as p reduced and that both the conditioning effect and scattering of the flashover voltage became small when pwas below 1012 Ω. Secondly, we produced two types of VIS, with CuCr spiral contacts and CuCr axial magnetic field contacts respctively, to conduct forty times of short-circuit current interruptions with 20-40 kArms. It was specified that p f o r the ceramic of the VI with spiral contacts reduced down to 104 Ω, and that breakdown vokage between terminals of the VI also decreased. pand breakdown voltage for the VI with AMF contacts did not decreased.
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