增强现实可穿戴设备用高折射率玻璃晶圆的光学特性

Optical Interference Coatings Conference (OIC) 2019 Pub Date : 2019-06-02 DOI:10.1364/OIC.2019.THC.3

Jue Wang, M. Cangemi, Jean-Francois Oudard, A. Bean, T. Dunn, C. Lee, Deanna A. Moschitta, Michael John Moore, N. Walker, M. Kapusta, K. Koch

{"title":"增强现实可穿戴设备用高折射率玻璃晶圆的光学特性","authors":"Jue Wang, M. Cangemi, Jean-Francois Oudard, A. Bean, T. Dunn, C. Lee, Deanna A. Moschitta, Michael John Moore, N. Walker, M. Kapusta, K. Koch","doi":"10.1364/OIC.2019.THC.3","DOIUrl":null,"url":null,"abstract":"Refractive index and optical thickness homogeneities of 99.979% and 99.984% were determined by using wafer-size metrologies. SiO2 & Nb2O5 based low loss anti-reflective coatings in the visible were realized for augmented reality wearables.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optical Characterization of High Refractive Index Glass Wafers for Augmented Reality Wearables\",\"authors\":\"Jue Wang, M. Cangemi, Jean-Francois Oudard, A. Bean, T. Dunn, C. Lee, Deanna A. Moschitta, Michael John Moore, N. Walker, M. Kapusta, K. Koch\",\"doi\":\"10.1364/OIC.2019.THC.3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Refractive index and optical thickness homogeneities of 99.979% and 99.984% were determined by using wafer-size metrologies. SiO2 & Nb2O5 based low loss anti-reflective coatings in the visible were realized for augmented reality wearables.\",\"PeriodicalId\":119323,\"journal\":{\"name\":\"Optical Interference Coatings Conference (OIC) 2019\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Interference Coatings Conference (OIC) 2019\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/OIC.2019.THC.3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Interference Coatings Conference (OIC) 2019","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/OIC.2019.THC.3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

利用晶圆尺寸测量法测定了99.979%和99.984%的折射率和光学厚度均匀性。在增强现实可穿戴设备中实现了基于SiO2和Nb2O5的可见低损耗抗反射涂层。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Optical Characterization of High Refractive Index Glass Wafers for Augmented Reality Wearables

Refractive index and optical thickness homogeneities of 99.979% and 99.984% were determined by using wafer-size metrologies. SiO2 & Nb2O5 based low loss anti-reflective coatings in the visible were realized for augmented reality wearables.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Optical Interference Coatings Conference (OIC) 2019

自引率

0.00%

发文量