运算放大器老化对电磁磁化率影响的预测

2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2015-05-26 DOI:10.1109/APEMC.2015.7175235

He Huang, A. Boyer, S. Ben Dhia, B. Vrignon

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引用次数: 14

摘要

本文研究了老化对CMOS运算放大器电磁磁化率的影响。老化影响可以通过MOSFET模型的几个参数的变化来建模，以预测在老化过程中运放块的电磁磁化率(EMS)的演变。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Prediction of aging impact on electromagnetic susceptibility of an operational amplifier

This paper deals with the impact of aging on the electromagnetic susceptibility level of a CMOS operational amplifier (opamp). The aging impact can be modelled by the variation of several parameters of the MOSFET model, to predict the evolution of electromagnetic susceptibility (EMS) of the opamp block during the aging process.

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2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

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